• 专利附录
  • 专利说明
  • 权利要求
  • 类似技术
  • 同族专利
  • 引用文献
  • 法律状态
  • 优先权
    • 专利摘要:
    An electromagnetic thickness measuring instrument to measure a thickness of a surface processing film on a metal comprises: (a) a plurality of instruction executing keys (14) provided on an operating front surface of the thickness measuring instrument; (b) a recording apparatus (15) enclosed in the main body of this instrument; (c) a terminal (10) for connecting a probe (3) to detect an electrical signal corresponding to the film thickness (D) in accordance with a distance to the metal when the probe (3) is pressed onto the metal; (d) a converting circuit (11) for converting the electrical signal which is obtained from the probe (3) to a digital value indicative of the film thickness (D); and (e) an operating circuit (13) for performing arithmetic operating processes of the digital value in accordance with instructions by the instruction executing keys (14). The results of the operating processes are outputted to the recording apparatus (15) in accordance with the measurement procedure which is instructed by the instruction executing keys (14).
    公开号:SU1561832A3
    申请号:SU853866307
    申请日:1985-02-19
    公开日:1990-04-30
    发明作者:Фудзита Тосио；Хасегава Коузи
    申请人:Кетт Электрик Лаборатори (Фирма)；
    IPC主号:
    专利说明:

    The invention relates to instrumentation technology and can be used to measure the thickness of a non-conductive film on a metal.
    The purpose of the invention is to increase the versatility and ease of use.
    FIG. 1 is a block diagram of the device; in fig. 2 - measuring circuit; in fig. 3 is a diagram of current change; FIG. 4 shows a device, a general view; in fig. 5 is a block diagram of the calibration algorithm; in fig. 6 is a block diagram of the device operation; in fig. 7 is a block diagram of the program input algorithm.
    An electromagnetic device for measuring the thickness of a non-conductive film on metal using a measuring probe 1 with an inductance coil 2 contains a housing 3, a terminal 4 for connecting the device to
     measuring probe 1 placed in the housing measuring unit 3 connected to terminal 4 and including a source 6 connected in series
    (alternating current, a current change indicator 7 and an analog-to-digital converter (not shown), and a microcomputer 8 connected to the output of the analog-digital converter 8. The device also has a thermal printing unit 9 connected to the output of the microcomputer 8, placed in the device case 3 and having an opening 10 for the information carrier on the upper part of the front panel 11 of the housing 3. On the lower part of the panel 11 are located the keys 12 of the microcomputer 8. In addition, the device includes a display 13, the screen 14 of which is located on the front between the opening 10 of the printing unit and the keys 12 of the microcomputer 8, connected in series the common current source 15, the second output of which is connected to the microcomputer 8, and the analog current source 16, the output of which is connected to the measuring unit 5, and the control input microcomputer output 8.
    Positions 17 and 18 are the calibration keys, position 19 is the reset key, position 20 is the strikeout key, position 21 is the input key, position 22 is the key for switching the printing unit 9, position1
    23- paper feed key, position
    24- key start program input. Electromagnetic device for
    measuring the thickness of the non-conductive film on the metal works as follows
    Current I comes from an alternating current source 6 through probe 1 consisting of a ferromagnetic core on which inductor 2 is wound.
    When the probe 1 touches the surface of the non-conductive film 25 on the base material 26, a change in current occurs, as shown in FIG. 3. If the calibration curve is made using a standard plate that is made of base material 26, on which the film has a certain thickness, according to the electromagnetic induction rule, the film thickness D can be determined by measuring the change in current.
    The measurement unit 5 includes an AC source 6, a current change indicator 7 and an analog-to-digital converter for converting the detected current change to a digital value. This digital value is inserted into the microcomputer 8, which has operative and permanent storage devices, and is converted into a film thickness of 25 based on
    five
    0
    five
    0
    five
    0
    five
    0
    five
    on a calibration curve, available in a persistent storage device. This thickness value is sent to the display circuit 13 and is displayed on its screen 14 or to the thermal printing unit 9 and is registered there. The circuit elements feed the source 15, the analog current source 16 is connected to supply a voltage having less oscillation to the measuring unit 5.
    Calibration of the device using two standard plates is performed prior to measurement. When the keys 17 and 18 are pressed, the interrupt signal is entered into the microcomputer 8, and the program indicated in the flowchart of FIG. 5. Probe 1 is pressed against a standard plate without a film of base material, i.e. the plate has a film thickness. The minimum value corresponding to Point C (FIG. 3), after changing the current il, shown in FIG. 3, is converted to a value below a certain threshold value D10, is held in measuring unit 5 and is stored in a random access memory (block 25, Fig. 5). Data corresponding to point C2 is likewise remembered by using a standard plate having a film thickness of µm (block 26, Fig. 5). The quadratic equation parameter indicating the calibration curve (Fig. 3) is determined based on the data at these two points, and thereafter the preparation for calculating the measured film thickness corresponding to the change in current AI is completed (block 27, Fig. 5).
    The main program is started when the reset key 19 is pressed. This program is held in the persistent storage in the microcomputer 8. If the measurement is not performed for 5 minutes or more, after pressing the button 19, the timer in the microcomputer 8 (in block 28, fig. 6) is set to 5 minutes to automatically turn off analog current source 16 to save power. Program block 29 shows a voltage drop or signals the operation of a current source 15 operating in such a backup power mode.
    The standard program skips the aforementioned loop of the program when probe 1 is used for measurement, i.e. when the current D1 reaches a value less than the threshold value L10, and proceeds from the differentiating block 30 of the program to block 31, thereby canceling the operation for counting the time of the five minute timer, i.e. It is assumed that a single measurement operation is performed in a significantly shorter time than the mouse. The measured value is expressed in predetermined units (block 32, Fig. 6), is entered into the display circuit 13 and then displayed on its screen or in a thermal printing unit 9.
    Thereafter, the preceding procedure is repeated and the measurement is continued.
    In accordance with the programs for checking the film thickness, the measurement is carried out at a specified time at specified points.
    Key 34 sets the number of measurements, when this number is reached, the average value of the measured values, the number of measurements, the standard deviation, the data and the sequence number of the measurement being made are automatically output. When the calibration button 18 is pressed, the operation indicated in FIG. 6 is interrupted. The program in FIG. 7 is triggered after pressing the double key 24 to start the program entry for assigning the digit 7 and the function (BATE data, block 35). The data is entered by the decimal key 36 (block 37, Fig. 7). Pressing the input key 21 terminates the assignment operation (block 38, fig. 7).
    Thus, the measuring operator does not need to put into operation any key after the start of the measurement operation. The operation of the program indicated in Fig. 6 is triggered by simply pressing probe 1 to the measured point, and the measurement results are output automatically, therefore, it is sufficient for the operator to simply follow the output values. Other physical units other than those specified may be added or excluded as an output of the measurement device. The timer can be set at another time.
    FIG. 3 curve 39 corresponds to material A, and curve 40 corresponds to material B, but the number of types of different materials is not limited.
    The key 22 for switching the printing unit is used if it is not necessary to output data from the printing unit 9.
    The 2Q strikeout key is used to erase the value measured erroneously.
    Key 41 is used when average is the value of An
    Tl - x
     Fg J
    (one)
    measurement data that has already been made. and the standard deviation S
    , - 2
    were derived without reference to a predetermined number of measurements.
    权利要求:
    Claims (1)
    [1]
    When the paper feed button 23 is pressed, the paper on which printing is performed is removed from the concave hole 10 of the printing unit 9, and the printed portion thereof can be cut off with a saw-tooth blade 42. Invention formula
    Electromagnetic device for measuring the thickness of an electrically non-conducting film on metal using a measuring probe in the form of an inductance coil, comprising a housing, a terminal for connecting the device: with a measuring probe placed in the housing measuring unit, connected to a terminal and including an AC source connected in series, a current change indicator and an analog-to-digital converter, and a microcomputer connected to the output of the analog-to-digital converter, characterized in that, in order to Increased versatility and convenience of operation, it is equipped with a thermal printing unit connected to the microcomputer output and located in the device case and having an opening for the information carrier on the upper part of the front panel of the case, on the lower part of which are located the keys of the microcomputer, the opening of the printing unit and the keys of the microcomputer, as well as connected in series by a common source
    715618328
    by the name of the current, the second output of which is connected to the measuring unit, and the one with the microcomputer, and the analogue control input, to the output of the microcurrent source, the output of which is the computer.
    L
    FIG. one
    g
    (, with
    S
    VV
    FIG. 2
    AJ.
    AND
    42
    12
    FIG.
    77
    YU
    nineteen
    18
    17
    21
    CJLJ
    R
    c5
    FIG. five
    WITH
    FIG. 6
    CZD
    FIG. 7
    类似技术:
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    同族专利:
    公开号 | 公开日
    EP0170341A1|1986-02-05|
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    DE3577600D1|1990-06-13|
    JPH0546481B2|1993-07-14|
    JPS6138503A|1986-02-24|
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    法律状态:
    优先权:
    申请号 | 申请日 | 专利标题
    JP59159294A|JPH0546481B2|1984-07-31|1984-07-31|
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